Si(Li) Segmented X-ray Detectors

Features

• For high performance X-ray measurements in Physics (PIXE, synchrotrons...), Non Destructive Assay and Medicine
• CANBERRA Eurisys proprietary techniques, available for more than 5 years
• Wide range of shapes (pixels, strips) and segmentations (straight strips, circular, single or double sided)
• Excellent energy resolution (150 eV at 5.9 keV, depending on geometries)
• Good behaviour at high count rates
• Thickness up to 5 mm
• Minimum pitch 300 µm Crosstalk 1% maximum
• Double sided segmentation capability, using CANBERRA Eurisys thin window proprietary technology
• Liquid nitrogen, cryogenerator or Peltier cooling
• Similar devices operating at room temperature for charged particle detection (see LTS data sheet)

Description

The CANBERRA ESLX-S detectors are manufactured using a proprietary technology allowing design of the best segmented silicon detectors available worldwide.

CANBERRA has applied the photolithography techniques -usually employed in microelectronics- to Si(Li) diodes. Thus, all kinds of segmentation patterns are possible (straight or curved strips, pixels, etc.). This technology has been proven for 5 years.

CANBERRA also offers a proprietary double sided thin window segmentation.

Segmentation offers many advantages:

• Suppression of dead zones between consecutive strips
• Small pitch: down to 300 µm
• Good behaviour at high count rates (up to 1 million pulses per second)
• 2-sided photolithography capability, with pitchs up to 300 µm
• Excellent FWHM resolution: typically 150 eV at 5.9 keV on cooled devices for X-ray measurements
• No measurable crosstalk.

The segmentation techniques fit with all cristal designs: circular, rectangular, etc...

Several ESLX-S detectors may be associated in arrays to increase angular covering or may be stacked in a unique cryostat, thus offering high energy X-ray absorption or imaging capabilities (gamma cameras).

ESLX-S detectors are cooled at liquid nitrogen temperature and withstand many thermal cycles.

Such characteristics make ESLX-S series the best choice for Xray measurements in many applications such as Physics experiments as well as non invasive detection.

Applications

• PIXE (microprobes)
• Synchrotron (EXAFS, medical beam lines)
• Nuclear Physics
• Non destructive control
• Radiography
• Imaging (gamma cameras)